Heating Microscope Upgrade to EMI III

EMI III is the successor to the EMI 2 image analysis software from Hesse Instruments. Customers who already have a heating microscope from Hesse Instruments or Leitz/Leica with EMI 2 can upgrade their system to EMI III easily.


Main features

Comparison of EMI 2 and EMI III

The EMI III heating microscope software was developed based on Hesse Instruments’ tried-and-tested EMI 2 image analysis software. The full functionality of EMI 2 has been included in EMI III, and the range of functions has been expanded to boost ease-of-use and to provide additional options for the preparation, performance and evaluation of measurements.

In addition to the expanded range of functions, EMI III improves upon EMI 2’s performance considerably. The software has been designed for current operating systems and hardware and therefore permits, among other things, more accurate resolution during image analysis and greater storage capacity for silhouettes of the test piece.

EMI 2EMI III
PerformanceDesigned for current operating systems
Designed for current hardware
Unlimited storage of images
Image analysis using greyscale method
Measurement preparationAssistance with camera image adjustment
  • Selection of image sections for analysis
  • Aids such as grids and specimen shapes
Method storage for measurement configuration and heating programmes
Measurement executionAutomatic furnace control
Real-time evaluation and display of results
Measurement evaluationDisplay of results: interactive display media
Input of detailed notes
Traceability of changes
Extended graph and image functions, including:
  • Zoom and image section
  • Result marker on graphs
Storage of generated graphs
Measurement managementExtended database
Extended archiving function
Extended export function
Automatic generation of test reportsShort test report
Long test report
  • Custom compilation
  • Insertion of notes, graphs, etc.
  • Insertion of user data, e.g. logo
  • Title page with text fields
Extended configuration optionsEvaluation parameters
Users and user rights
User data
  • Logo
  • Address
Extension with modules

Scope of supply and installation of upgrade

In order to guarantee the improved performance of EMI III, the upgrade to this version includes not only the EMI III heating microscope software but also the following hardware and software components:

  • Measuring station computer:  EMI III comes installed on a preconfigured and ready-to-use measuring station computer. In addition to the operating system and heating microscope software, the computer is equipped with all of the necessary hardware interfaces.
  • Network-compatible CCD camera:  A more powerful camera with faster transmission delivers images in the necessary resolution for the newly developed evaluation algorithms. The camera is compatible with the existing macro lens of the EM201.
  • Temperature acquisition device:  To complement EMI III’s communication, the Hesse Instruments furnace control unit is equipped with a new temperature acquisition device.

The upgrade installation is designed and documented so that you can easily carry out the process yourself. After a single adjustment procedure, the upgraded heating microscope is ready for use.

Further information on our installation service

Contact us for further information


Benefits at a glance

Improved performance

  • State-of-the-art hardware and software
  • High-performance image analysis
  • Advanced evaluation algorithms
  • Exact determination of the outline of test pieces by greyscale analysis
  • Finely resolved greyscale analysis as part of automatic image analysis
  • Network-compatible CCD camera 
  • Faster, digital transmission of recorded images
  • Lossless conversion  
  • Improved image quality

Improved efficiency

  • Clear, structured user interface
  • Straightforward and intuitive operation
  • Short training periods for staff
  • Clear presentation of measurements and measurement results
  • Wider range of functions than EMI 2
  • Easier operation
  • Enhanced control during the preparation and evaluation of measurements
  • Easier and more-detailed documentation of results
  • Methodological management
  • Time savings during measurement preparation
  • Reduction of systematic errors
  • Automatic evaluation and documentation
  • Optimum and rapid evaluation of measurements
  • Automatic generation of test reports
  • Interactive display of measurement results
  • Linking of graphs, images and numerical values
  • Rapid individual evaluation
  • Custom design of graphs and test reports

Control and flexibility

  • Configuration of evaluation parameters
  • Direct influence on automatic image analysis
  • Adjustment of parameters to different measurement concepts, including atypical ones
  • Traceability of changes in measurement evaluation
  • All changes to an existing measurement are documented automatically
  • Reduction of systematic errors

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